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Topological quantum technologies
dc.contributor.author | Marino, Antonio | |
dc.date.accessioned | 2023-06-26T16:09:43Z | |
dc.date.available | 2023-06-26T16:09:43Z | |
dc.date.issued | 2021-04-08 | |
dc.identifier.uri | http://elea.unisa.it/xmlui/handle/10556/6610 | |
dc.identifier.uri | http://dx.doi.org/10.14273/unisa-4674 | |
dc.description | 2019 - 2020 | it_IT |
dc.description.abstract | Precision measurements through engineered quantum systems are achieving new primacies in sensitivity and accuracy and therefore novel potential applications ranging from mechanical and electrical engineering to material science, nano-medicine, environmental science, and, in general, frontiers of technological development at large. For instance, the one-electron transistors and the one-spin qubits have been used as single quantum probes to detect electrical fields with unprecedented levels of precision. On the other hand, sensing schemes based on single quantum systems are strongly vulnerable even to very low levels of noise, due to the fragility of quantum coherence and the extreme sensitivity of quantum coherent probes. Recent efforts in quantum sensing and quantum metrology address this issue resorting to decoupling techniques and quantum correction schemes with quantum control feedback loops. Unfortunately, the experimental complexity and the control and precision requirements of such correction schemes, are exceedingly demanding both with present-day and currently foreseeable technologies. .. [edited by Author] | it_IT |
dc.language.iso | en | it_IT |
dc.publisher | Universita degli studi di Salerno | it_IT |
dc.subject | Topological order-squashed entanglement | it_IT |
dc.title | Topological quantum technologies | it_IT |
dc.type | Doctoral Thesis | it_IT |
dc.subject.miur | FIS/02 FISICA TEORICA, MODELLI E METODI MATEMATICI | it_IT |
dc.contributor.coordinatore | Donsì, Francesco | it_IT |
dc.description.ciclo | XXXIII ciclo | it_IT |
dc.contributor.tutor | Illuminati, Fabrizio | it_IT |
dc.identifier.Dipartimento | Ingegneria Industriale | it_IT |
dc.contributor.referee | Alba, Vincenzo | it_IT |
dc.contributor.referee | Dalmonte, Marcello | it_IT |